Integrated Circuit Electrical Overstress Failure Pareto Rank

The semiconductor industry has witnessed steady growth over the last few years thanks to emerging applications, which are driving the growth of major semiconductor components. Reliable operation of these components is very important in any given application and to ensure reliability components must receive extensive testing and burn-in. Despite this, integrated circuit (IC) failures are still inevitable. One of the common failure mechanisms that affects all IC components irrespective of the type of application is electrical overstress (EOS).
In this webinar, we will discuss the possible root cause of EOS failures, why it ranks high in the failure pareto, and ways to mitigate EOS failure risks.
Co-sponsored by: Angela Robinson
Speaker(s): Ashok Alagappan
Agenda:
6:00 Networking
6:30 Speaker
8:30 Adjourn
Virtual: https://events.vtools.ieee.org/m/420968